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[1]张臻悦,李钰,郭文达*,等. X射线光电子能谱在矿物浮选表界面研究中的应用进展 [J].武汉工程大学学报,2025,47(06):591-599,613.[doi:10.19843/j.cnki.CN42-1779/TQ.202503015]
　ZHANG Zhenyue,LI Yu,GUO Wenda*,et al. Advances in the application of X-ray photoelectron spectroscopy in interfacial phenomena in mineral flotation [J].Journal of Wuhan Institute of Technology,2025,47(06):591-599,613.[doi:10.19843/j.cnki.CN42-1779/TQ.202503015]
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X射线光电子能谱在矿物浮选表界面研究中的应用进展
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《武汉工程大学学报》[ISSN:1674-2869/CN:42-1779/TQ]

卷:
47
期数:
2025年06期
页码:
591-599,613
栏目:
现代大化工
出版日期:
2025-12-31

文章信息/Info

Title:
Advances in the application of X-ray photoelectron spectroscopy in interfacial phenomena in mineral flotation
文章编号:
1674 - 2869（2025）06 - 0591 - 09
作者:
张臻悦1; 2; 李钰1; 郭文达*2; 孙宁杰2; 刘德峰2; 吴汉军1; 徐彪3
1. 武汉工程大学化学与环境工程学院，湖北 武汉 430205；
2. 武汉工程大学兴发矿业学院，湖北 武汉 430074；
3. 武钢中冶工业技术服务有限公司，湖北 武汉 430070
Author(s):
ZHANG Zhenyue1; 2;  LI Yu1;  GUO Wenda*2;  SUN Ningjie2;  LIU Defeng2;  WU Hanjun1;  XU Biao3
1. School of Chemistry and Environmental Engineering，Wuhan Institute of Technology，Wuhan 430205，China；
2. Xingfa School of Mining Engineering，Wuhan Institute of Technology，Wuhan 430074，China；
3. Wugang Zhongye Industrial Technology Service Co., Ltd，Wuhan 430070，China
关键词:
X射线光电子能谱; 浮选机理; 应用进展
Keywords:
X-ray photoelectron spectroscopy;  flotation mechanism;  application advance
分类号:
TD91
DOI:
10.19843/j.cnki.CN42-1779/TQ.202503015
文献标志码:
A
摘要:
随着现代仪器检测技术的不断进步，越来越多的检测手段被引入矿物浮选的机理研究中，其中X射线光电子能谱(XPS)作为一种先进的表面表征分析技术，在揭示矿物浮选过程的微观机制方面发挥着重要作用。综述了XPS分析原理，梳理了XPS的定量与定性研究，总结了XPS在矿物浮选机理研究方面的应用进展。通过XPS可以分析矿物表面元素组成和化学态变化，明确矿物中元素的存在形式，确定浮选药剂的特征原子在矿物表面吸附的化学态，从而可以探究矿物表面活性位点和药剂之间的吸附作用机制。若辅以元素含量及化学态组分含量分析，还可进一步判定药剂吸附能力的强弱。最后，对XPS技术在矿物浮选领域的发展进行了展望，未来将继续完善XPS仪器和理论发展方面的研究。随着XPS与其他多种手段的结合，XPS在矿物浮选机理研究中的应用将更加广泛，为矿产资源的开发利用做出更多贡献。
Abstract:
With the advancement of modern instrumental detection techniques, an increasing number of analytical?methods are being applied to investigate the mechanisms of mineral flotation. Among these, X-ray photoelectron spectroscopy (XPS)?serves as a powerful surface characterization technique and plays a significant role in elucidating the microscopic mechanisms of the mineral flotation process. In this paper, we systematically summarized the fundamental principles of XPS analysis, reviewed its applications in both qualitative and quantitative studies, and outlined recent progress in utilizing XPS to explore flotation mechanisms. XPS enables the analysis of elemental composition and chemical state changes on mineral surfaces, clarifies the speciation of elements in minerals, and identifies the chemical states of characteristic atoms from flotation reagents adsorbed on mineral surfaces. This information helps reveal the mechanisms of adsorption between active sites on mineral surfaces and reagent molecules. When combined with elemental content and chemical speciation analysis, XPS can further assess the relative adsorption capacity of reagents. Future prospects for XPS technology in the field of mineral flotation are discussed, including ongoing improvements in instrumentation and theoretical developments. As XPS is increasingly integrated with other analytical techniques, its applications in mineral flotation research are expected to expand, thereby contributing more significantly to the development and utilization of mineral resources.

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相似文献/References:

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备注/Memo

备注/Memo:
收稿日期：2025-03-18
基金项目：国家自然科学基金(52204277,52374273)；湖北省自然科学基金创新群体项目(2023AFA044)
作者简介：张臻悦，博士，教授。Email：zyzxmu@wit.edu.cn
*通信作者：郭文达，博士，副教授。Email：gedaya123@163.com
更新日期/Last Update: 2026-01-05