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[1]吴艳光1,汪 洋1,唐 丰1,等.溶胶-凝胶法制备硫化亚锡薄膜及其光电性能[J].武汉工程大学学报,2015,37(12):49-52.[doi:10. 3969/j. issn. 1674-2869. 2015. 12. 011]
 WANG Yang,,et al.Preparation of tin sulfide thin films by sol-gel method and its optical properties[J].Journal of Wuhan Institute of Technology,2015,37(12):49-52.[doi:10. 3969/j. issn. 1674-2869. 2015. 12. 011]
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溶胶-凝胶法制备硫化亚锡薄膜及其光电性能(/HTML)
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《武汉工程大学学报》[ISSN:1674-2869/CN:42-1779/TQ]

卷:
37
期数:
2015年12期
页码:
49-52
栏目:
材料科学与工程
出版日期:
2016-01-14

文章信息/Info

Title:
Preparation of tin sulfide thin films by sol-gel method and its optical properties
文章编号:
1674-2869(2015)12-0049-04
作者:
吴艳光1汪 洋1唐 丰1孙 剑2
1.武汉工程大学材料科学与工程学院,湖北 武汉 430074;2.中国地质大学材料与化学学院,湖北 武汉 430074
Author(s):
WU Yan-guang1 WANG Yang1TANG Feng1 SUN Jian2
1. School of Materials Science and Engineering, Wuhan Institute of Technology, Wuhan 430074, China;2. Faculty of Materials Science and Chemistry, China University of Geosciences, Wuhan 430074, China
关键词:
溶胶-凝胶法硫化亚锡退火温度X射线衍射半导体
Keywords:
sol-gel tin sulfide anneal temperature X ray diffraction semiconductor
分类号:
O484.4
DOI:
10. 3969/j. issn. 1674-2869. 2015. 12. 011
文献标志码:
A
摘要:
以二水合氯化亚锡和硫脲为反应物,2-甲氧基乙醇为溶剂,单乙醇胺为稳定剂,采取溶胶-凝胶法,以玻璃片为基片制备了硫化亚锡薄膜. 采用X射线衍射、霍尔效应测试、紫外光透过测试等技术表征了硫化亚锡薄膜的性质. 结果表明:最后的退火温度对薄膜中硫化亚锡的含量和电子迁移率有较大的影响,退火温度越高,硫化亚锡的含量也就越多,薄膜中电子迁移率也升高;硫化锡对紫外光有很好的透过率,但随着硫化亚锡含量的增加,薄膜对紫外光的透过率逐渐降低. 此外,在硫与锡的物质量之比为1.25时,硫化亚锡半导体的类型均为n型;硫化锡的导电性能差,而硫化亚锡有很好的半导体性能.
Abstract:
The sulfide thin films were prepared on glass by sol-gel method, using thiocarbamide and two stannous chloride hydrate, methoxyethanol and monoethanoamine as reactants, solvent and stabilizer, respectively. The properties of the films were characterized by X ray diffraction, Holzer effect test and ultraviolet light transmission test. The results show that the content of tin sulfide and the electron mobility of the films are affected by the annealing temperature, and both of them increase with the increase of annealing temperature. The stannic sulfide has a good transmittance to ultraviolet light, however, the ultraviolet transmittance of the films is gradually decreased with the content of tin sulfide increasing. In addition, all the types of the semiconductor is n type when the proportion of S/Sn is 1.25. The conductive properties of stannic sulfide is poor, but the tin sulfide has good semiconductive properties.

参考文献/References:

[1] HUANG C C, LIN Y J, CHUANG C Y, et al. Conduction-type control of SnSx films prepared by the sol–gel methodfor different sulfur contents[J]. Journal of Alloys and Compounds, 2013,553(10):208-211.[2] 高玉翠. 制备及退火工艺对SnS薄膜性能的影响[D]. 西安:西安理工大学,2006.GAO Yu-cui. Effect of anneal and microstructure on characteristic of SnS film[D]. Xi’an: Xi’an University of Technology, 2006.(in Chinese)[3] 徐建梅,张德. 溶胶-凝胶法的技术进展与应用现状[J]. 地质科技情报,1999,18(14):1-5.XU Jian-mei, ZHANG De. Technique advance and current application situation of sol-gel[J]. Geological Science and Technology Information,1999,18(14):1-5.(in Chinese)[4] 邱永华,史伟民,魏光普,等. 真空蒸发法制备SnS薄膜及其光电性能研究[J]. 光电子·激光,2006, 17(7):817-820.QIU Yong-hua, SHI Wei-min, WEI Guang-pu, et al. Characterization of the SnS thin Films deposited by vacuum evaporation[J]. Journal of Optoectronics · Laser, 2006, 17(7):817-820.(in Chinese)[5] 陈岩清. 电沉积SnS薄膜及其性能研究[D]. 福州:福州大学,2006.CHEN Yan-qing. Study of the properties of tin sulfide films prepared by pulse-form electro-deposition[D]. Fuzhou: Fuzhou University, 2006.(in Chinese)[6] 卢旭晨,徐廷献. 溶胶-凝胶法及其应用[J]. 陶瓷学报,1998,19(1):53-57.LU Xu-chen,XU Ting-xian. Sol-gel process and its application[J]. Journal of Ceramics,1998,19(1):53-57.(in Chinese)[7] 孙志华,刘明辉. 溶胶-凝胶法在金属表面制备耐蚀涂层的研究现状[J]. 腐蚀与防护,2000,21(11):513-514.SUN Zhi-hua, LIU Ming-hui.Status quo in the preparation of anti-corrosive coating on metal surface by sol-gel process[J]. Corrosion & Protection, 2000,21(11):513-514.(in Chinese)

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备注/Memo

备注/Memo:
收稿日期:2015-10-28作者简介:吴艳光(1983-),男,湖北咸宁人,讲师,博士. 研究方向:功能材料.
更新日期/Last Update: 2016-01-20